Testonica lab

• 06.02.2018
• Embedded Instrumentation
  Air-TeQ
  Quick Instruments

Testonica Lab just signed an agreement with Air-TeQ for that sales and distribution of their Quick Instruments solutions within the Nordic, Baltic and Benelux area. “Testonica is a valued partner of ours already for quite some time, so it’s additionally a pleasure for all of us their Quick Instruments are actually ready for distribution”, states Director at Air-TeQ, Lars Kongsted-Jensen. “It’s opening new doorways to all of us their embedded instrument IPs now may be used inside a more open and versatile way”.

• 26.09.2017
• ChipVORX
  DDR3
  DDR4
  Embedded Instrumentation
  FPGA
  Marginal Defects
  NFF
  No-fault Found
  Little Difficulty Found
  NTF
  Quick Instruments

Marginal Defects, for example excessive voids in solder joints, dewetting, mind-in-pillow and alike don’t always cause malfunctions, but may lead to system performance issues, elevated error rates, intermittent problems along with other sporadic stability issues noticed in certain operation modes, at certain workloads or occurring inside a apparently stochastic manner. Consequently, Marginal Defects can lead to No-faultOrDifficulty Found (NFF/NTF) scenarios.

• 12.09.2017
• ChipVORX
  Embedded Instrumentation
  FPGA
  Quick Instruments

In the August-Sept issue, IEEE Instrumentation & Measurement Magazine printed our technical paper which was initially presented this past year at AUTOTESTCON conference in Anaheim, CA. It is among six conference papers selected for that journal on the quality basis from the total of 80 AUTOTESTCON’2016 contributions.